| File information: | |
| File name: | 4200 CV AN.pdf [preview 4200 CV AN] |
| Size: | 354 kB |
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| Mfg: | Keithley |
| Model: | 4200 CV AN 🔎 |
| Original: | 4200 CV AN 🔎 |
| Descr: | Keithley SCS 4200 4200 CV AN.pdf |
| Group: | Electronics > Other |
| Uploaded: | 15-03-2020 |
| User: | Anonymous |
| Multipart: | No multipart |
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| Decompress result: | OK | |
| Extracted files: | 1 | |
File name 4200 CV AN.pdf Number 2239 Application Note Gate Dielectric Capacitance-Voltage Series Characterization Using the Model 4200 Semiconductor Characterization System Introduction Understanding MOS-Capacitor Maintaining the quality and reliability of gate oxides is one of C-V Measurements the most critical and challenging tasks in any semiconductor fab. C-V measurements are typically made on a capacitor-like device, With feature sizes shrinking to 0.18 | ||

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